On-the-fly tests for non-ideal true random number generators

Hardware implementations of statistical tests are needed to detect failures and statistical weaknesses of entropy sources in True Random Number Generators on the fly. Current implementations of these tests work under the assumption that the entropy source produces independent, identically distributed (IID) numbers. However, some entropy sources produce non-IID data and rely on compression to provide the full entropy. Currently there are no embedded test implementations suitable for this type of entropy source. We provide the first FPGA implementation of embedded tests that estimate the generated min-Entropy and verify if it is within the expected boundaries.