• DocumentCode
    727743
  • Title

    Optimizing process conditions using design of experiments - A wire bonding, semiconductor assembly process case study

  • Author

    Xiaoying Wang ; Chee-Cheng Chen

  • Author_Institution
    Dept. of Manage. Sci. & Eng., Shanghai Univ., Shanghai, China
  • fYear
    2015
  • fDate
    22-24 June 2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The striking competitiveness of modern-day companies is more than ever a direct function of their ability to implement high yielding processes and continuous optimization. Such optimization, however, is becoming increasingly harder to realize, due to the growing complexities of processes, networks, manufacturing system structures as well as business processes. The limitation of optimization tools exacerbates the difficulties in achieving competitiveness. The objective of this work is to investigate the merits and demerits of integrating systems tools for optimizing breakthroughs in manufacturing or business processes using DMAIC and DOE. The application and power of process optimization are examined using the semiconductor manufacturing industry. We seek to demonstrate that “integrated methodology” application to process optimization can enable enterprises to achieve substantial innovation and contribute to their quality standards, lower their cost and boost their competitiveness irrespective of the limitations that current tools may have.
  • Keywords
    assembling; design of experiments; innovation management; lead bonding; manufacturing systems; semiconductor industry; DMAIC; DOE; business processes; continuous optimization; design of experiments; innovation; integrated methodology; manufacturing processes; manufacturing system structures; optimization tools; process conditions; process optimization; quality standards; semiconductor assembly process; semiconductor manufacturing industry; wire bonding; yielding processes; Assembly; Distortion; Optimization; Process control; Six sigma; Wires; DMAIC; DOE; Process optimization; Semiconductor manufacture; Tools limitation; integrated methodology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Service Systems and Service Management (ICSSSM), 2015 12th International Conference on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4799-8327-8
  • Type

    conf

  • DOI
    10.1109/ICSSSM.2015.7170324
  • Filename
    7170324