DocumentCode
728004
Title
Multiple-model hypothesis testing based on 2-SPRT
Author
Bao Liu ; Jian Lan ; Li, X. Rong
Author_Institution
Center for Inf. Eng. Sci. Res. (CIESR), Xi´an Jiaotong Univ., Xi´an, China
fYear
2015
fDate
1-3 July 2015
Firstpage
183
Lastpage
188
Abstract
Double sequential probability ratio test (2-SPRT), as an extended version of SPRT to cope with the no-upper-bound problem, is extended to the multiple-model hypothesis testing (MMHT) approach, called 2-MMSPRT, for detecting unknown events that may have multiple prior distributions. Not only does it address the mis-specified problem of the SPRT based MMHT method (MMSPRT), but it also can be expected to provide most efficient detection in the sense of minimizing the maximum expected sample size subject to error probability constraints. Specifically, we proved the theoretical validity of 2-SPRT for the problem of testing hypotheses with multivariate normal densities. Moreover, we present a method of forced independence and identical distribution (i.i.d.) to optimally map the non-i.i.d. likelihood ratio sequence to an i.i.d. one, by which we solve the problem of SPRT and 2-SPRT for dynamic systems with a non-identical distribution. Finally, 2-MMSPRT´s asymptotic efficiency is also verified. Performance of 2-MMSPRT is evaluated for model-set selection problems in several scenarios. Simulation results demonstrate the asymptotic effectiveness of the proposed 2-MMSPRT compared with the MMSPRT.
Keywords
maximum likelihood estimation; probability; statistical testing; 2-MMSPRT; 2-SPRT; SPRT based MMHT method; double sequential probability ratio test; error probability constraints; independence and identical distribution; model-set selection problems; multiple-model hypothesis testing; multiple-model hypothesis testing approach; multivariate normal densities; non-iid likelihood ratio sequence; testing hypotheses; Approximation methods; Covariance matrices; Error probability; Mathematical model; Simulation; Testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2015
Conference_Location
Chicago, IL
Print_ISBN
978-1-4799-8685-9
Type
conf
DOI
10.1109/ACC.2015.7170732
Filename
7170732
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