• DocumentCode
    728114
  • Title

    Minimum achievable decay rates of the discrete linear inclusion

  • Author

    Essick, Ray ; Dullerud, Geir

  • Author_Institution
    Dept. of Mech. Sci. & Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2015
  • fDate
    1-3 July 2015
  • Firstpage
    1089
  • Lastpage
    1094
  • Abstract
    In this paper we provide a scheme for estimating the minimum achievable exponential decay rate of a switched linear system via output feedback control. The output feedback stabilization of switched linear systems using path-dependent controllers is characterized exactly in [8] in terms of an increasing family of linear matrix inequalities; the feasibility of any one of these inequalities allows for the construction of a stabilizing controller, while infeasible conditions are disregarded. In this paper we use the infeasibility of these conditions to provide a lower bound on the achievable decay rate of the closed-loop system. We consider the special case of the discrete linear inclusion - e.g., a system with unrestricted switching - and develop a family of estimators of the minimum achievable decay rate for the system. For controllers of a fixed path-dependence, the resulting bounds provide an interval containing the minimum performance level whose length may be made as small as desired. The lower bound of these intervals is used as a nondecreasing estimation of the achievable decay rate. A simple, physically motivated example is provided to demonstrate the practical application of this result.
  • Keywords
    closed loop systems; discrete systems; feedback; linear matrix inequalities; linear systems; stability; closed-loop system; discrete linear inclusion; linear matrix inequalities; minimum achievable decay rates; output feedback control; output feedback stabilization; path-dependent controllers; switched linear system; Closed loop systems; Estimation; Joints; Linear matrix inequalities; Switches; Symmetric matrices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2015
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4799-8685-9
  • Type

    conf

  • DOI
    10.1109/ACC.2015.7170878
  • Filename
    7170878