DocumentCode :
728708
Title :
Low-temperature sintering of (Ba0.85Ca0.15)(Zr0.1Ti0.9)O3 ceramics and thick-films
Author :
Yang Bai ; Matousek, Ales ; Hughes, Hana ; Button, Tim W. ; Ou, Canlin
Author_Institution :
Central Eur. Inst. of Technol. - CEITEC, Brno, Czech Republic
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
60
Lastpage :
63
Abstract :
This paper reports low-temperature sintering methods for the (Ba0.85Ca0.15)(Zr0.1Ti0.9)O3 (50BCZT) ceramics and thick-films. A commercial borosilicate glass and Li2O have been investigated as sintering aids. Bulk ceramic samples with 1 wt% borosilicate glass and sintered at 1200°C exhibited d33 and keff (effective electromechanical coupling coefficient) values of approximately 160 pC/N and 0.2 respectively, which were 35 % and 54 % of values measured on ceramic samples without glass addition and sintered at higher temperatures. Bulk ceramic samples with 0.6 wt% Li2O addition and sintered at 1100°C exhibited d33 and keff values of about 130 pC/N and 0.16 respectively. 50BCZT thick-films with 0.6 wt% Li2O and sintered at 1100°C exhibited d31 values of about 70 pC/N, which reached 77 % of counterparts without addition and sintered above 1400°C. This shows that the sintering temperature of 50BCZT can be reduced by more than 300°C, thus making it compatible with the use of Ag-Pd as a co-sintered electrode, which is more cost-effective than Pt.
Keywords :
barium compounds; calcium compounds; piezoceramics; piezoelectric thin films; piezoelectricity; sintering; (Ba0.85Ca0.15)(Zr0.1Ti0.9)O3; borosilicate glass; ceramics; electromechanical coupling coefficient; low-temperature sintering; sintering aids; sintering temperature; temperature 1100 degC; temperature 1200 degC; thick-films; Ceramics; Electrodes; Glass; Lead; Powders; Temperature; Temperature measurement; Li2O; borosilicate glass; lead-free; low-temperature sintering; piezoelectric; thick-film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/ISAF.2015.7172668
Filename :
7172668
Link To Document :
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