DocumentCode
728717
Title
Structural and electrical studies of mixed metal/ceramic composite dielectric thin films
Author
Abdullah, A. ; Munir, A. ; Saleemi, A.S. ; Saqib, M. ; Anis-ur-Rehman, M.
Author_Institution
Sch. of Sci. & Technol., Univ. of Manage. & Technol., Sialkot, Pakistan
fYear
2015
fDate
24-27 May 2015
Firstpage
136
Lastpage
138
Abstract
Cerium oxide (Rare earth oxide ceramic) films were coated on ITO glass slides where CeO2 was obtained by a simplified sol-gel method. The layer of molten NiO (Metal oxide) was physiosorped on ceria. The synthesis parameters like molarity of the precipitating agent and annealing temperature of the as prepared films were optimized. The X-ray diffraction was used for the confirmation of the phase, crystal structure and determination of crystallite sizes. The morphology of annealed films was studied using atomic force microscopy. The ac electrical measurements were done using LCR meter at room temperature and in frequency range 1 kHz to 3 MHz. The ac conductivity, dielectric constant and dielectric loss were determined using the electrical data.
Keywords
X-ray diffraction; annealing; atomic force microscopy; cerium compounds; composite materials; dielectric losses; dielectric thin films; electrical conductivity; nickel compounds; permittivity; sol-gel processing; CeO2-NiO; ITO; ITO glass slides; LCR meter; X-ray diffraction; ac conductivity; ac electrical measurements; annealing temperature; atomic force microscopy; cerium oxide films; crystal structure; crystallite sizes; dielectric constant; dielectric loss; frequency 1 kHz to 3 MHz; mixed metal-ceramic composite dielectric thin films; phase structure; physiosorption; precipitating agent; rare earth oxide ceramic films; sol-gel method; temperature 293 K to 298 K; Conductivity; Dielectric constant; Dielectric losses; Films; Frequency measurement; Solids; Conductivity; Dielectric; Dielectric loss;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location
Singapore
Type
conf
DOI
10.1109/ISAF.2015.7172688
Filename
7172688
Link To Document