• DocumentCode
    728720
  • Title

    Structure and dielectric properties of Bi2O3 doped BaTiO3-(Na1/4Bi3/4)(Mg1/4Ti3/4)O3 lead-free ceramics

  • Author

    Xuechen Huang ; Hanxing Liu ; Hua Hao ; Chuyu Peng ; Lin Zhang ; Yun Sun ; Yuanhang Zhou ; Minghe Cao

  • Author_Institution
    State Key Lab. of Adv. Technol. for Mater. Synthesis & Process., Wuhan Univ. of Technol., Wuhan, China
  • fYear
    2015
  • fDate
    24-27 May 2015
  • Firstpage
    155
  • Lastpage
    158
  • Abstract
    Bi2O3 doped BaTiO3-(Na1/4Bi3/4)(Mg1/4Ti3/4)O3 (BT-NBMT) polycrystalline ceramics were prepared by solid state reaction method. The effects of Bi2O3 additive on the microstructure and dielectric properties of BT-NBMT ceramics were investigated. The Bi2O3 effectively lowered the sintering temperature and improved the bulk density of BT-NBMT ceramics. The low-temperature stability first improved and then deteriorated with increasing Bi2O3 concentration. The core-shell microstructure undertook responsibility for the good dielectric temperature stability. The dielectric ceramic samples with good permittivity and low dielectric loss were obtained at a moderated sintering temperature. The results also suggest that the developed BT-NBMT ceramics may serve as a promising candidate for multilayer ceramic capacitors.
  • Keywords
    barium compounds; bismuth compounds; ceramics; dielectric losses; permittivity; sintering; sodium compounds; (BaTiO3-(Na0.25Bi0.75)(Mg0.25Ti0.75)O3):Bi2O3; BT-NBMT ceramics; bulk density; core-shell microstructure; dielectric loss; dielectric temperature stability; lead free ceramics; low temperature stability; permittivity; polycrystalline ceramics; sintering temperature; solid state reaction method; Ceramics; Dielectric constant; Microstructure; Temperature distribution; Thermal stability; BT-NBMT; Bi2O3; Core-shell microstructure; temperature stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
  • Conference_Location
    Singapore
  • Type

    conf

  • DOI
    10.1109/ISAF.2015.7172693
  • Filename
    7172693