Title :
Thermal expansion characteristics of [001]-oriented PIN-PMN-PT single crystal
Author :
Gemeng Huang ; Kexin Song ; Ming Ma ; Zhenrong Li ; Shiji Fan ; Zhuo Xu
Author_Institution :
Key Lab. of the Minist. of Educ. & Int., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
Thermal expansion characteristics of unpoled and poled 0.23PIN-0.47PMN-0.30PT single crystals were measured in the temperature ranges from -70 to 300°C using DIL402C dilatometer during the heating and cooling process. The thermal expansion anomalies were detected below 0°C, as well as the obvious expansion about 0.11% and contraction about 0.31% along [001] direction was observed respectively around rhombohedral (R) → tetragonal (T) and tetragonal (T) → cubic(C) phase transition temperature for poled PIN-PMN-PT. Compared to the poled single crystal, thermal expansion responded at phase transition temperatures were inconspicuous for unpoled single crystal. The significant differences were exhibited between poled and unpoled crystals, which were related to polarization state and phase transitions in single crystals. The temperature-dependent of dielectric properties were investigated to further confirm the relationships between thermal strain anomalies and phase transition.
Keywords :
cooling; ferroelectric transitions; lead compounds; thermal expansion; DIL402C dilatometer; Pb(In0.5Nb0.5)O3-Pb(Mg0.33Nb0.67)O3-PbTiO3; [001] direction; [001]-oriented PIN-PMN-PT single crystal; cooling process; dielectric properties; heating process; polarization state; rhombohedral-tetragonal phase transition temperature; temperature 70 degC to 300 degC; temperature-dependence; tetragonal-cubic phase transition temperature; thermal expansion anomalies; thermal strain anomalies; unpoled PIN-PMN-PT single crystal; Cooling; Crystals; Heating; Strain; Temperature; Temperature measurement; Thermal expansion; PIN-PMN-PT; Thermal expansion; phase transition; single crystal;
Conference_Titel :
Applications of Ferroelectric, International Symposium on Integrated Functionalities and Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), 2015 Joint IEEE International Symposium on the
Conference_Location :
Singapore
DOI :
10.1109/ISAF.2015.7172725