DocumentCode
729036
Title
Prediction of aging impact on electromagnetic susceptibility of an operational amplifier
Author
He Huang ; Boyer, Alexandre ; Ben Dhia, Sonia ; Vrignon, Bertrand
Author_Institution
LAAS, Toulouse, France
fYear
2015
fDate
26-29 May 2015
Firstpage
86
Lastpage
89
Abstract
This paper deals with the impact of aging on the electromagnetic susceptibility level of a CMOS operational amplifier (opamp). The aging impact can be modelled by the variation of several parameters of the MOSFET model, to predict the evolution of electromagnetic susceptibility (EMS) of the opamp block during the aging process.
Keywords
CMOS integrated circuits; MOSFET; ageing; electromagnetic compatibility; operational amplifiers; CMOS opamp; EMS; MOSFET model; aging impact prediction; complementary metal-oxide semiconductor; electromagnetic susceptibility; metal oxide semiconductor field-effect transistor; operational amplifier; Aging; Electromagnetic compatibility; Electromagnetic interference; Frequency measurement; Integrated circuit modeling; Stress; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4799-6668-4
Type
conf
DOI
10.1109/APEMC.2015.7175235
Filename
7175235
Link To Document