Title :
Prediction of aging impact on electromagnetic susceptibility of an operational amplifier
Author :
He Huang ; Boyer, Alexandre ; Ben Dhia, Sonia ; Vrignon, Bertrand
Author_Institution :
LAAS, Toulouse, France
Abstract :
This paper deals with the impact of aging on the electromagnetic susceptibility level of a CMOS operational amplifier (opamp). The aging impact can be modelled by the variation of several parameters of the MOSFET model, to predict the evolution of electromagnetic susceptibility (EMS) of the opamp block during the aging process.
Keywords :
CMOS integrated circuits; MOSFET; ageing; electromagnetic compatibility; operational amplifiers; CMOS opamp; EMS; MOSFET model; aging impact prediction; complementary metal-oxide semiconductor; electromagnetic susceptibility; metal oxide semiconductor field-effect transistor; operational amplifier; Aging; Electromagnetic compatibility; Electromagnetic interference; Frequency measurement; Integrated circuit modeling; Stress; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175235
