DocumentCode :
729049
Title :
Fast data pattern based electromagnetic interference evaluation for IC packaging
Author :
Huang, Nick K. H. ; Li Jun Jiang
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
272
Lastpage :
274
Abstract :
Electromagnetic interference (EMI) is becoming more serious when the data rate of the digital system continues increasing. However, its modeling and analysis are very challenging. In this paper, a novel electromagnetic superposition method is developed to model the IC packaging electromagnetic emission. It employs the equivalence principle to obtain the electromagnetic field response over a broad spectrum. Then it uses the linear property of the passive parasitic system to superpose the contribution of different signals on the packaging. As a result, with certain pre-calculations, it is convenient to compute the electromagnetic emission efficiently from different signals with various data pattern combinations, which benefits identifying worst case scenario. In addition, data reconstruction can be evaluated through the phase shift, which simplifies identifying the EMI of any pulse bit pattern. This work provides a basic modeling framework for comprehensive radiation studies.
Keywords :
electromagnetic fields; electromagnetic interference; equivalent circuits; integrated circuit packaging; EMI; IC packaging electromagnetic emission; data pattern combinations; data rate; data reconstruction; digital system; electromagnetic field response; electromagnetic interference; electromagnetic superposition method; equivalence principle; passive parasitic system; phase shift; pulse bit pattern; Electromagnetic interference; Electromagnetics; Integrated circuit modeling; Integrated circuit packaging; Surface reconstruction; Surface treatment; Wires; EM radiated emission; EMI; IC packaging; cavity mode; linear superposition; via trace radiation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
Type :
conf
DOI :
10.1109/APEMC.2015.7175254
Filename :
7175254
Link To Document :
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