• DocumentCode
    729068
  • Title

    New integrated workflow for EMI simulation

  • Author

    Benson Wei ; Pytel, Steven G.

  • Author_Institution
    ANSYS, Inc., Canonsburg, PA, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    162
  • Lastpage
    165
  • Abstract
    The purpose of this study is to predict electromagnetic interference (EMI) using circuit simulation integration with 2.5-D and 3-D full-wave, electromagnetic (EM) field solvers. These simulations predict the electronic system performance using signal integrity (SI), power integrity (PI) and far field radiation metrics while incorporating the entire system virtually. SPICE, IBIS, PCB layout, Connectors, and 3-D enclosures are all included within the virtual system to accurately predict system performance. The study presented in this paper shows how to simulate EMI in a complex high-speed I/O system in the time- and frequency-domains using the virtual 3-D enclosure by dynamically linking ANSYS SIwave, a specialized design platform for SI, PI and EMI analysis of electronic packages and PCBs including circuit analysis and ANSYS HFSS, a full-wave EM tool. The concepts shown in this paper can be applied to any kind of high-speed I/O system.
  • Keywords
    circuit simulation; computational electromagnetics; electric connectors; electromagnetic interference; electronics packaging; input-output programs; printed circuit layout; ANSYS HFSS; ANSYS SIwave; EMI simulation; IBIS; PCB layout; SPICE; circuit analysis; circuit simulation integration; complex high-speed I-O system; connectors; electromagnetic field solvers; electromagnetic interference prediction; electronic packages; electronic system performance prediction; far field radiation metrics; frequency-domains; full-wave EM tool; integrated workflow; power integrity; signal integrity; time-domains; virtual 3D enclosures; virtual system; Circuit simulation; Electromagnetic interference; Finite element analysis; Integrated circuit modeling; Layout; Scattering parameters; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175276
  • Filename
    7175276