Title :
Radiated emissions modelling from near-field data - toward international standards
Author :
Ramanujan, Abhishek ; Lafon, Frederic ; Fernandez-Lopez, Priscila
Author_Institution :
EMC Dept., Valeo GEEDS, Créteil, France
Abstract :
As electromagnetic compatibility (EMC) gains ground in today´s world of electronics, integrated circuit (IC) and printed circuit board (PCB) modelling methods are of paramount importance during development of EMC compliant products. One such aspect focuses on modelling the emissions from ICs and PCBs, both conducted and radiated forms. This work proposes a method for modelling the radiated emissions of ICs (PCBs, ...) from near-field data. It also describes a universal exchange format for representing and sharing the model data between industrials, academics and EDA simulation tools.
Keywords :
electromagnetic compatibility; integrated circuit modelling; integrated circuit testing; printed circuit design; EDA simulation tools; EMC; IC radiated emissions; electromagnetic compatibility; integrated circuit; printed circuit board modelling methods; radiated emissions modelling; universal exchange format; Electromagnetic compatibility; Integrated circuit modeling; Magnetic analysis; Magnetic field measurement; Transforms;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175293