Title :
Design of the multifunction IC-EMC test board with off-board probes for evaluating a microcontroller
Author :
Yin-Cheng Chang ; Ping-Yi Wang ; Hsu, Shawn S. H. ; Mao-Hsu Yen ; Yen-Tang Chang ; Chiu-Kuo Chen ; Da-Chiang Chang
Author_Institution :
Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the capability of providing the confident measurements up to 1 GHz. Meanwhile, the cost of performing a bunch of different testing methods on implementing various test boards is reduced.
Keywords :
electromagnetic compatibility; integrated circuit measurement; integrated circuit testing; microcontrollers; test equipment; IC-EMC measurements; IC-EMC test board; IEC standards; MCU testing; microcontroller testing; multifunction test board; off-board probes; Boards; Electromagnetic compatibility; IEC standards; Insertion loss; Integrated circuits; Probes; electromagnetic compatibility (EMC); emission; immunity; integrated circuit (IC); microcontroller (MCU);
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175301
