DocumentCode :
729095
Title :
Near field measurement for EMC validation of electronics board in IMA
Author :
Marot, Christian ; Jaber, Anass
Author_Institution :
AIRBUS Group, Toulouse, France
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
486
Lastpage :
489
Abstract :
Today the electronic embedded architecture in aircraft is based on traditional approaches on the independent aircraft systems with modules called LRU, Line Replaceable Unit. Needs to reduce cost and weight of the embedded electronic units pass by the implementation of a more modular electronics in the architectures AC with elementary module. Such EMC avionic tests description at electronics modules levels are not defined today. The objectives of those studies are to give technical data to defined EMC test setup and associated limits at modules levels to respect environment requirements.
Keywords :
aircraft testing; avionics; electromagnetic compatibility; AC architectures; EMC avionic test description; EMC validation; IMA; LRU modules; cost reduction; electronic embedded architecture; electronics board; electronics module levels; elementary module; embedded electronic units; independent aircraft systems; line replaceable unit; near field measurement; Immunity testing; Laboratories; Magnetic field measurement; Monitoring; Packaging; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
Type :
conf
DOI :
10.1109/APEMC.2015.7175308
Filename :
7175308
Link To Document :
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