• DocumentCode
    729098
  • Title

    Gap influence and mode converter design for non-destructive complex permittivity measurement using circular TE01-mode open-end waveguide

  • Author

    Tanaka, Ken ; Nishikata, Atsuhiro

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo, Japan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    463
  • Lastpage
    466
  • Abstract
    This paper proposes a non-destructive complex permittivity measurement method using circular TE01 mode. First, we discuss on the influence of gap by comparing conventional coaxial probe method and circular TE01 mode method that we propose. They are quantitatively compared based on the analysis with the help of EM-field simulator. It is shown that the proposed method is about 10 times insensitive to the air gap. Next, we show the actual TE01mode converter design. The structure consists of 16-dividing waveguide network and TE01mode excitation part. Two models are designed. First, X-band model is designed and manufactured. Whole structure analysis by the simulator result agreed well with measured S11 parameter. Next, K-band model is designed with improved reflection characteristics. Whole structure analysis showed that the relative bandwidth for reflection below -20dB achieved 37.8% within K-band frequencies.
  • Keywords
    circular waveguides; coaxial waveguides; permittivity measurement; 16-dividing waveguide network; EM-field simulator; K-band model; TE01 mode converter design; TE01 mode excitation part; X-band model; circular TE01 mode; coaxial probe method; gap influence; nondestructive complex permittivity measurement method; open-end waveguide; Dielectric measurement; Dielectrics; Frequency conversion; Frequency measurement; Numerical models; Reflection; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175312
  • Filename
    7175312