Title :
Investigation of measurement uncertainties and errors in EMI measurement apparatus
Author :
Jian Song ; Yong Xin Guo
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
Several measurement uncertainties and errors associated with EMI measurement apparatus have been investigated in this paper. The standard uncertainties of different resolution bandwidth (RBW) selections and dwell time settings in the test receiver during calibration process are found to be comparably small. The signal synchronization between the signal generator and the test receiver is found to be an important factor in cable path attenuation measurement. The results obtained in this paper provide additional knowledge to the existing test standards used in the industry.
Keywords :
calibration; electric noise measurement; electromagnetic interference; measurement errors; measurement uncertainty; test equipment; EMI measurement apparatus; cable path attenuation measurement; calibration process; measurement errors; measurement uncertainties; test receiver; Bandwidth; Calibration; Measurement uncertainty; Receivers; Signal generators; Synchronization; Uncertainty; dwell time; resolution bandwidth; signal synchronization; test receiver;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175319