DocumentCode :
729111
Title :
Current challenges in component-level and system-level ESD simulation
Author :
Rosenbaum, Elyse ; Kuo-Hsuan Meng ; Yang Xiu ; Thomson, Nicholas
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
333
Lastpage :
336
Abstract :
Electronic systems and components contain large numbers of elements and have a complex non-linear response to ESD; thus, passing ESD qualification on the first pass is unlikely to occur unless the robustness is verified by means of simulation prior to manufacturing. For component-level ESD verification, the primary challenge is in regards to computational efficiency; for system-level ESD verification, component and test bed modeling present major challenges.
Keywords :
electrostatic discharge; component-level ESD simulation; system-level ESD simulation; Computational modeling; Discharges (electric); Electrostatic discharges; Integrated circuit modeling; Pins; Solid modeling; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
Type :
conf
DOI :
10.1109/APEMC.2015.7175328
Filename :
7175328
Link To Document :
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