• DocumentCode
    729126
  • Title

    High dip insertion loss due to periodic defect structure in high speed transmission line

  • Author

    Dau-Chyrh Chang ; Hsiao-Bin Liang ; Jian-Ren Wang ; Vito Chen ; Jun-Pin Zhang ; Yo-Sheng Lin

  • Author_Institution
    Oriental Inst. of Technol., Taipei, Taiwan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    494
  • Lastpage
    497
  • Abstract
    Periodic impedance caused by periodic structure in transmission lines is simulated by high frequency 3-D EM simulators and RF/MMW circuit simulator. From the simulated data, the dip trend of insertion loss, which is also called as suck-out effect of high speed bulk cable, is presented. A simplified N-section LC lumped-circuit model with periodic circuit elements interpreting the periodic structure of transmission line is proposed for describing the dip trend, suck-out effect, of insertion loss. With proper number of sections, under the condition of quasi-static, the lumped circuit model could also perform the suck-out effect due to the periodic structure up to several tens GHz frequency range.
  • Keywords
    LC circuits; telecommunication transmission lines; N-section LC lumped-circuit model; RF-MMW circuit simulator; high dip insertion loss; high frequency 3D EM simulator; high speed transmission line; insertion loss; periodic defect structure; suck-out effect; Insertion loss; Integrated circuit modeling; Market research; Microstrip; Periodic structures; Power transmission lines; Propagation losses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175347
  • Filename
    7175347