DocumentCode :
72913
Title :
Example-Based Super-Resolution via Structure Analysis of Patches
Author :
Changhyun Kim ; Kyuha Choi ; Jong Beom Ra
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Volume :
20
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
407
Lastpage :
410
Abstract :
In example-based super-resolution, it is difficult to determine appropriate high-frequency (HF) patches from a training database by using only the information of one input image. In this letter, we utilize the sharpness of high-resolution (HR) patch candidates for the reliable determination of HF patches. For each input patch, we first preselect a sufficient number of HF patch candidates and produce HR patches by adding the candidates to the input patch. After removing the outlier patches, we then reselect several HF patches according to the patch characteristic for producing the final HR image. This reselection procedure is optimized for edge patches and non-edge patches, respectively. Experimental results show that the proposed algorithm provides sharper details compared to the existing algorithms.
Keywords :
image reconstruction; image resolution; HF patches; HR patch candidates; example-based super-resolution; high-frequency patches; high-resolution patch; nonedge patches; outlier patches; patch characteristic; reselection procedure; structure patch analysis; training database; Example-based; reconstruction constraint; sharpness; super-resolution;
fLanguage :
English
Journal_Title :
Signal Processing Letters, IEEE
Publisher :
ieee
ISSN :
1070-9908
Type :
jour
DOI :
10.1109/LSP.2013.2249514
Filename :
6471750
Link To Document :
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