Title :
Case learnings of power noise impact on SATA
Author :
Yinglei Ren ; Su, Thonas ; Hsu, Jimmy ; Liu, Bruce ; Ming Wei ; Wei Shen ; Li, Y.L.
Author_Institution :
CPD, Intel Asia-Pacific R&D Ltd., Shanghai, China
Abstract :
With the increase of data rate, signal integrity (SI) becomes a bigger challenge for printed circuit board (PCB) designs. Power noise as well as signal loss, inter-symbol interference (ISI), crosstalk needs to be taken into account to ensure a good quality signal design. In this paper, a design case is shared where power noise greatly impacts SATA performance and leads to hard disk (HDD) disconnection. Noise source and noise coupling path are root-caused with simulation and measurement data. And learnings from this case is summarized for future attention.
Keywords :
crosstalk; hard discs; intersymbol interference; network synthesis; printed circuits; system buses; ISI; PCB design; SATA performance; crosstalk; hard disk disconnection; intersymbol interference; noise coupling path; power noise impact case learning; printed circuit board design; signal integrity; signal loss; signal quality; Boards; Couplings; Crosstalk; Noise; Noise measurement; Silicon; Switches; SATA HDD disconnection; channel noise scan (CNS); noise coupling; power noise; signal integrity (SI); switching voltage regulator (VR);
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175371
