• DocumentCode
    729212
  • Title

    On nanonet electronics, percolation doping, and the limits of ohm´s law

  • Author

    Alam, Muhammad A.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    21
  • Lastpage
    21
  • Abstract
    Summary form only given. As the future of Moore´s law appears uncertain, Electronics is being reinvented with a broader focus on flexible electronics, bioelectronics, and energy-harvesting. In this regard, a material based on nanonets of Carbon Nanotubes or Si/ZnO/SiGe Nanowires have been used as channel materials for thin-film transistors for flexible/transparent electronics, as sensor elements for label-free bio-sensors, and as transparent top electrode for solar cells. A lack of predictive transport models, however, had stymied the translation of impressive laboratory experiments to practical, disruptive technology. The classical theory of bulk semiconductors, developed over last 50 years in close collaboration with experimentalists, device physicists, numerical analysts, and computer scientists, does no longer apply. In this talk, I will discuss a simple theory of the Nanonet devices based on 2D percolation and fractal dynamics to show how these simple/intuitive approach challenged conventional wisdom and helped us achieve world record performance in several very different technology applications.
  • Keywords
    fractals; nanoelectronics; percolation; semiconductor doping; 2D percolation; Moore law; carbon nanotubes; flexible electronics; fractal dynamics; nanonet electronics; nanowires; ohm law limits; percolation doping; predictive transport models; thin film transistors; transparent electronics; Carbon nanotubes; Computers; Flexible electronics; II-VI semiconductor materials; Nanostructured materials; Silicon; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175530
  • Filename
    7175530