DocumentCode
729234
Title
A comprehensive study on interface perpendicular MTJ variability
Author
Won Ho Choi ; Jongyeon Kim ; Ahmed, Ibrahim ; Kim, Chris H.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
fYear
2015
fDate
21-24 June 2015
Firstpage
89
Lastpage
90
Abstract
In conclusion, we quantify the impact of tF variation on Δ and Ic variability in PMTJ. The Δ variability shows considerably more tF variation dependency compared to Ic variability counterpart, offering smaller increase of Δ and Ic as tF variation is improved to make all random MTJ samples meet a retention time specification.
Keywords
MRAM devices; magnetic tunnelling; random-access storage; MTJ; magnetic tunnelling junciton; Electronic mail; Integrated circuits; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location
Columbus, OH
Print_ISBN
978-1-4673-8134-5
Type
conf
DOI
10.1109/DRC.2015.7175569
Filename
7175569
Link To Document