DocumentCode :
729234
Title :
A comprehensive study on interface perpendicular MTJ variability
Author :
Won Ho Choi ; Jongyeon Kim ; Ahmed, Ibrahim ; Kim, Chris H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
89
Lastpage :
90
Abstract :
In conclusion, we quantify the impact of tF variation on Δ and Ic variability in PMTJ. The Δ variability shows considerably more tF variation dependency compared to Ic variability counterpart, offering smaller increase of Δ and Ic as tF variation is improved to make all random MTJ samples meet a retention time specification.
Keywords :
MRAM devices; magnetic tunnelling; random-access storage; MTJ; magnetic tunnelling junciton; Electronic mail; Integrated circuits; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
Type :
conf
DOI :
10.1109/DRC.2015.7175569
Filename :
7175569
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=729234
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