Author_Institution :
Dept. of Mater. Sci. & Eng., Northwestern Univ., Evanston, IL, USA
Abstract :
Two-dimensional materials have emerged as promising candidates for next-generation electronic and optoelectronic applications [1]. As is common for new materials, much of the early work has focused on measuring and optimizing intrinsic properties on small samples (e.g., micromechanically exfoliated flakes) under idealized conditions (e.g., vacuum and/or cryogenic temperature environments). However, real-world devices and systems inevitably require large-area samples that are integrated with dielectrics, contacts, and other semiconductors at standard temperature and pressure conditions. These requirements are particularly challenging to realize for two-dimensional materials since their properties are highly sensitive to surface chemistry, defects, and the surrounding environment. This talk will thus explore methods for improving the uniformity of solution-processed two-dimensional materials with an eye toward realizing scalable processing of large-area thin-films. For example, density gradient ultracentrifugation allows the solution-based isolation of transition metal dichalcogenides (e.g., MoS2, WS2, MoSe2, and WSe2) and boron nitride with homogeneous thickness down to the single-layer level [2]. Similarly, two-dimensional black phosphorus is isolated in solution with the resulting flakes showing field-effect transistor mobilities and on/off ratios that are comparable to micromechanically exfoliated flakes [3]. In addition to solution processing, this talk will also report on the integration of two-dimensional materials with dielectrics and other semiconductors. In particular, atomic layer deposition of dielectrics on two-dimensional black phosphorus suppresses ambient degradation, thereby preserving electronic properties in field-effect transistors at atmospheric pressure conditions [4]. Finally, p-type semiconducting carbon nanotube thin films are combined with n-type single-layer MoS2 to form p-n heterojunct- on diodes [5]. The atomically thin nature of single-layer MoS2 implies that an applied gate bias can electrostatically modulate the doping on both sides of the p-n heterojunction concurrently, thereby providing five orders of magnitude gate-tunability over the diode rectification ratio in addition to unprecedented anti-ambipolar behavior when operated as a three-terminal device. This anti-ambipolar behavior can be generalized to other solution-processed p-n heterojunctions including p-type semiconducting carbon nanotubes and n-type indium gallium zinc oxide [6].
Keywords :
atomic layer deposition; carbon nanotubes; field effect transistors; molybdenum compounds; nanostructured materials; p-n heterojunctions; semiconductor thin films; MoS2; ambient degradation; anti-ambipolar behavior; atmospheric pressure conditions; atomic layer deposition; boron nitride; density gradient ultracentrifugation; dielectrics; diode rectification ratio; electronic properties; field-effect transistor mobilities; field-effect transistors; gate bias; homogeneous thickness; intrinsic properties; large-area samples; large-area thin-films scalable processing; magnitude gate-tunability; micromechanically exfoliated flakes; n-type indium gallium zinc oxide; n-type single-layer MoS2; next-generation electronic applications; optoelectronic applications; p-n heterojunction diodes; p-type semiconducting carbon nanotube thin films; p-type semiconducting carbon nanotubes; solution-based isolation; solution-processed two-dimensional materials; transition metal dichalcogenides; two-dimensional black phosphorus; Dielectrics; Heterojunctions; Temperature; Temperature measurement; Temperature sensors; Transistors;