DocumentCode :
729288
Title :
Modeling the PiezoElectronic Transistor - a nanoscale, strain-based transduction device for fast low power switching
Author :
Martyna, Glenn J. ; Elmegreen, Bruce ; Newns, Dennis M.
Author_Institution :
Phys. Sci., IBM TJ Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
221
Lastpage :
222
Abstract :
We have invented a post-CMOS transduction device based on a piezoelectrically driven metal insulator transition termed the PiezoElectronic Transistor (PET) [1]. An input voltage pulse activates a piezoelectric element (PE) [2] which transduces input voltage into an electro-acoustic pulse that in turn drives an insulator to metal transition (IMT) in a piezoresistive element (PR) [3,4]; the transition efficiently transduces the electro-acoustic pulse to voltage. Using the known properties of bulk materials, we show using modeling that the PET achieves multi-GHz clock speeds with voltages as low as 0.1 V and a large On/Off switching ratio (≈104) for digital logic [1]. The PET switch is compatible with CMOS-style logic. At larger scale the PET is predicted to function effectively as a large-area low voltage device for use in sensor applications and at larger yet as a RF-switch with an excellent figure of merit. Three demonstration devices have been fabricated to show proof of concept [5].
Keywords :
CMOS integrated circuits; acoustoelectric devices; semiconductor device models; transistors; CMOS transduction device; CMOS-style logic; PET; RF-switch; bulk materials; digital logic; electro-acoustic pulse; figure of merit; insulator to metal transition; low power switching; piezoelectric element; piezoelectrically driven metal insulator transition; piezoelectronic transistor; piezoresistive element; sensor; strain-based transduction device; Computational modeling; Integrated circuit modeling; Low voltage; Piezoresistance; Positron emission tomography; Strain; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
Type :
conf
DOI :
10.1109/DRC.2015.7175646
Filename :
7175646
Link To Document :
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