DocumentCode :
729625
Title :
Thermal behavior of flip chip LED packages using electrical conductive adhesive and soldering methods
Author :
Yang Liu ; Guoqi Zhang ; Fenglian Sun ; Xuejun Fan ; Wong, Cell K. Y. ; Yuan, Cadmus A. ; Tuo Zheng ; Chao Huang ; Chenglong Zheng ; Hongyu Tang
Author_Institution :
Sch. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Harbin, China
fYear :
2013
fDate :
10-12 Nov. 2013
Firstpage :
4
Lastpage :
7
Abstract :
This paper investigated thermal behavior of three kinds of FC packages connected with AuSn, SAC305, and electrical conductive adhesive using 1-D thermal resistance circuit method, and finite element method as well as experimental measurements. Simulation results indicated that the low thermal conductivity of electrical conductive adhesive led to high thermal resistance at this layer and decreased the thermal dissipation of the package as a bottleneck when the heat power was 0.74W in this study. The junction temperature and Rjc of adhesive package was much higher than the other two and led to package failure. SAC soldering package showed similar heat dissipation ability with the AuSn one. Additionally, the results of FE analysis show better agreement with experimental observation compared with 1-D thermal resistance circuit method.
Keywords :
conductive adhesives; cooling; failure analysis; finite element analysis; flip-chip devices; gold alloys; light emitting diodes; semiconductor device packaging; soldering; thermal conductivity; thermal resistance; tin alloys; 1D thermal resistance circuit; AuSn; FE analysis; SAC soldering package; SAC305 adhesive; adhesive package; electrical conductive adhesive; finite element method; flip chip LED packages; heat dissipation; junction temperature; package failure; power 0.74 W; soldering methods; thermal behavior; thermal conductivity; thermal dissipation; Electronic packaging thermal management; Heat transfer; Resistance heating; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Lighting (ChinaSSL), 2013 10th China International Forum on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-2249-9
Type :
conf
DOI :
10.1109/SSLCHINA.2013.7177300
Filename :
7177300
Link To Document :
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