• DocumentCode
    729657
  • Title

    Optical characterization of a light bulb with the waffle pack LED WLP module

  • Author

    Huihua Liu ; Lo, Jeffery C. C. ; Lee, S. W. Ricky

  • Author_Institution
    Center for Adv. Microsyst. Packaging, Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • fYear
    2013
  • fDate
    10-12 Nov. 2013
  • Firstpage
    142
  • Lastpage
    146
  • Abstract
    As the emergence of solid state lighting, light emitting diodes (LEDs) have been developed for applications of tremendous usage. For indoor lighting, LED light bulbs share large portions of market. The chip on board (CoB) package is a very attractive architecture for high brightness LEDs which can lead improved price competiveness, package integration and thermal performance. Waffle pack LED packaging technology has been proposed based on wafer level packaging (WLP) technology and remote phosphor configuration. The package has a huge potential for mass production and cost reduction. However, so far there were few optical results reported. In current study, photometry tests of both the component and light bulb were made. Optical indices such as luminous flux, CCTs and near field / planar light distributions were measured. The package was compared with the commercial CoB module. A ray tracing tool was used for helping experimental validation. The results showed that the waffle pack produces white light with improved angular color uniformity. The two components have similar lighting distributions, and waffle pack produces higher optical output than traditional CoB package.
  • Keywords
    LED lamps; chip-on-board packaging; lighting; CoB package; LED light bulbs; WLP technology; angular color uniformity; chip on board package; cost reduction; high brightness LED; indoor lighting; light bulb optical characterization; light emitting diodes; lighting distributions; mass production; ray tracing tool; remote phosphor configuration; solid state lighting; wafer level packaging; waffle pack LED packaging technology; Integrated optics; Lead; Optical variables control; Optical variables measurement; Reliability; Semiconductor device measurement; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Lighting (ChinaSSL), 2013 10th China International Forum on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-2249-9
  • Type

    conf

  • DOI
    10.1109/SSLCHINA.2013.7177334
  • Filename
    7177334