DocumentCode :
729657
Title :
Optical characterization of a light bulb with the waffle pack LED WLP module
Author :
Huihua Liu ; Lo, Jeffery C. C. ; Lee, S. W. Ricky
Author_Institution :
Center for Adv. Microsyst. Packaging, Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear :
2013
fDate :
10-12 Nov. 2013
Firstpage :
142
Lastpage :
146
Abstract :
As the emergence of solid state lighting, light emitting diodes (LEDs) have been developed for applications of tremendous usage. For indoor lighting, LED light bulbs share large portions of market. The chip on board (CoB) package is a very attractive architecture for high brightness LEDs which can lead improved price competiveness, package integration and thermal performance. Waffle pack LED packaging technology has been proposed based on wafer level packaging (WLP) technology and remote phosphor configuration. The package has a huge potential for mass production and cost reduction. However, so far there were few optical results reported. In current study, photometry tests of both the component and light bulb were made. Optical indices such as luminous flux, CCTs and near field / planar light distributions were measured. The package was compared with the commercial CoB module. A ray tracing tool was used for helping experimental validation. The results showed that the waffle pack produces white light with improved angular color uniformity. The two components have similar lighting distributions, and waffle pack produces higher optical output than traditional CoB package.
Keywords :
LED lamps; chip-on-board packaging; lighting; CoB package; LED light bulbs; WLP technology; angular color uniformity; chip on board package; cost reduction; high brightness LED; indoor lighting; light bulb optical characterization; light emitting diodes; lighting distributions; mass production; ray tracing tool; remote phosphor configuration; solid state lighting; wafer level packaging; waffle pack LED packaging technology; Integrated optics; Lead; Optical variables control; Optical variables measurement; Reliability; Semiconductor device measurement; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Lighting (ChinaSSL), 2013 10th China International Forum on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-2249-9
Type :
conf
DOI :
10.1109/SSLCHINA.2013.7177334
Filename :
7177334
Link To Document :
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