Title :
An efficient and simple algorithm to restore passivity for measured S-parameters data
Author :
Chakrabarti, Amrita ; Agili, Sedig ; Morales, Aldo ; Resso, Mike
Author_Institution :
Electr. Eng. Program, Penn State Harrisburg, Middletown, PA, USA
Abstract :
Signal Integrity is now an integral part of the design cycles for consumer electronics devices. One of the major issues in signal integrity is passivity check and restoration of passive devices. This paper will introduce a new efficient technique of passivity restoration based on finding the local minima in the singular value vs. frequency stemming from the system matrix. The proposed new technique for passivity enforcement has the potential to restore the passivity in a real or simulated system represented by S-parameters without making significant changes in the system´s original S-parameters or the systems characteristics.
Keywords :
S-parameters; T invariance; integrated circuit design; passivation; semiconductor device measurement; semiconductor device models; S-parameters data; consumer electronics devices; frequency stemming; passive device restoration; passivity check; passivity restoration technique; signal integrity; Algorithm design and analysis; Consumer electronics; Fitting; Frequency measurement; Matrix decomposition; Scattering parameters; Singular value decomposition; High speed Interconnects; Passivity; S-parameters;
Conference_Titel :
Consumer Electronics (ISCE), 2015 IEEE International Symposium on
Conference_Location :
Madrid
DOI :
10.1109/ISCE.2015.7177849