DocumentCode :
730010
Title :
Digitally-compatible ring oscillator frequency driven tuning of CN-TFT amplifiers: Performance compensation under statistical and morphological variations
Author :
Banerjee, Suvadeep ; Gupta, Man Prakash ; Banerjee, Aritra ; Kumar, Satish ; Chatterjee, Abhijit
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2015
fDate :
24-26 June 2015
Firstpage :
1
Lastpage :
6
Abstract :
Carbon Nanotube network based Thin-Film Transistors (CN-TFTs) are excellent candidates for next generation flexible electronics applications. However CN-TFT circuits suffer from imperfections due to morphological variations of fabricated carbon nanotube geometries that cause wide performance variations in analog amplifiers built from these CN-TFTs. Improved fabrication methods and sophisticated process control techniques are not sufficient for tackling these imperfections. In this paper, a new digitally-compatible tuning method is proposed for CN-TFT based amplifier designs. The amplifier is placed in a ring-oscillator configuration using two additional digital inverters, appropriately modified to allow oscillation of the inverter-inverting amplifier-inverter configuration. The frequency of oscillation is then used to drive a tuning algorithm that recovers the performance of the amplifier under statistical and morphological fabrication process variations. The method is very easy to implement and simulation studies show excellent results.
Keywords :
amplifiers; carbon nanotubes; invertors; oscillators; process control; thin film transistors; CN-TFT amplifiers; analog amplifiers; carbon nanotube geometry; carbon nanotube network; digital inverters; digitally-compatible ring oscillator; frequency driven tuning; inverter-inverting amplifier-inverter configuration; morphological variations; performance compensation; process control; statistical variations; thin-film transistors; Capacitors; Ring oscillators; Testing; Thin film transistors; Tuning; CN-TFT Circuits; Post-CMOS; Self-tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed-Signal Testing Workshop (IMSTW), 2015 20th International
Conference_Location :
Paris
Type :
conf
DOI :
10.1109/IMS3TW.2015.7177860
Filename :
7177860
Link To Document :
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