• DocumentCode
    730017
  • Title

    Experiences with an industrial analog fault simulator and engineering intuition

  • Author

    Sunter, Stephen

  • Author_Institution
    Mentor Graphics, Ottawa, ON, Canada
  • fYear
    2015
  • fDate
    24-26 June 2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    While working with designers and DFT engineers in companies evaluating an “industrial-strength” analog fault simulator, it became apparent that intuition and theory often differ regarding random sampling of defects to simulate. This paper explores these differences. In one case, it was hoped that simulating more defects would increase the estimated coverage. In a second case, it was assumed that pre-simulation analysis of a circuit would more efficiently reveal defects that need to be simulated. In a third, engineering intuition said at least 1% of all potential defects must be simulated to estimate coverage. In a fourth case, it was thought that fault coverage for portions of a circuit could be gleaned from results for faults randomly injected into the whole circuit. In a fifth, the types of faults injected were assumed to greatly affect coverage. In a last case, intuitively it seemed that improving a test to detect the most-likely defects that were undetected would have the greatest impact on coverage.
  • Keywords
    analogue integrated circuits; fault simulation; circuit portions; engineering intuition; fault coverage; industrial analog fault simulator; potential defects; pre-simulation analysis; random sampling; Circuit faults; Integrated circuit modeling; Mathematical model; Sociology; Statistics; Testing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signal Testing Workshop (IMSTW), 2015 20th International
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2015.7177867
  • Filename
    7177867