Title :
Logistic similarity metric learning for face verification
Author :
Lilei Zheng ; Idrissi, Khalid ; Garcia, Christophe ; Duffner, Stefan ; Baskurt, Atilla
Author_Institution :
INSA-Lyon, Univ. de Lyon, Lyon, France
Abstract :
This paper presents a new method for similarity metric learning, called Logistic Similarity Metric Learning (LSML), where the cost is formulated as the logistic loss function, which gives a probability estimation of a pair of faces being similar. Especially, we propose to shift the similarity decision boundary gaining significant performance improvement. We test the proposed method on the face verification problem using four single face descriptors: LBP, OCLBP, SIFT and Gabor wavelets. Extensive experimental results on the LFW-a data set demonstrate that the proposed method achieves competitive state-of-the-art performance on the problem of face verification.
Keywords :
face recognition; learning (artificial intelligence); probability; Gabor wavelet; LBP; OCLBP; SIFT; face verification problem; logistic loss function; logistic similarity metric learning; probability estimation; similarity decision boundary; Silicon; Metric learning; cosine similarity; face recognition; face verification; linear transformation;
Conference_Titel :
Acoustics, Speech and Signal Processing (ICASSP), 2015 IEEE International Conference on
Conference_Location :
South Brisbane, QLD
DOI :
10.1109/ICASSP.2015.7178311