DocumentCode :
73109
Title :
The Study of Thermal Resistance Deviation of High-Power LEDs
Author :
Shang-Pin Ying ; Han-Kuei Fu ; Wei-Feng Tang ; Rong-Ci Hong
Author_Institution :
Dept. of Opto-Electron. Syst. Eng., Minghsin Univ. of Sci. & Technol., Hsinchu, Taiwan
Volume :
61
Issue :
8
fYear :
2014
fDate :
Aug. 2014
Firstpage :
2843
Lastpage :
2848
Abstract :
The high-power light-emitting diode (LED) lighting is especially essential in the high-temperature applications, such as the street lighting and automotive lighting. However, there is more than 70% of electrical power converted into heat due to the low electrical-optical conversion efficiency. Because of the characteristics of the semiconductor, the electrical property of LEDs is sensitively varying with operating temperature. These deviations affect the measurement of light and electricity. In this paper, the steady-state thermal measurement techniques developed by the National Institute of Standards and Technology are used to study the deviation of thermal resistance in different electrical and thermal conditions. The consistent trends of simulations and experiments represent that the design of the heat dissipating path and geometry affects the measurement of thermal resistance.
Keywords :
cooling; light emitting diodes; street lighting; thermal resistance; thermal resistance measurement; automotive lighting; electrical-optical conversion efficiency; heat dissipating path; high-power LED; high-temperature applications; light emitting diode lighting; steady-state thermal measurement techniques; street lighting; thermal resistance deviation; Electrical resistance measurement; Heat sinks; Light emitting diodes; Resistance heating; Temperature measurement; Thermal resistance; Light-emitting diode (LED); thermal engineering; thermal measurement; thermal resistance; thermal resistance.;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2014.2330340
Filename :
6845354
Link To Document :
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