DocumentCode
73109
Title
The Study of Thermal Resistance Deviation of High-Power LEDs
Author
Shang-Pin Ying ; Han-Kuei Fu ; Wei-Feng Tang ; Rong-Ci Hong
Author_Institution
Dept. of Opto-Electron. Syst. Eng., Minghsin Univ. of Sci. & Technol., Hsinchu, Taiwan
Volume
61
Issue
8
fYear
2014
fDate
Aug. 2014
Firstpage
2843
Lastpage
2848
Abstract
The high-power light-emitting diode (LED) lighting is especially essential in the high-temperature applications, such as the street lighting and automotive lighting. However, there is more than 70% of electrical power converted into heat due to the low electrical-optical conversion efficiency. Because of the characteristics of the semiconductor, the electrical property of LEDs is sensitively varying with operating temperature. These deviations affect the measurement of light and electricity. In this paper, the steady-state thermal measurement techniques developed by the National Institute of Standards and Technology are used to study the deviation of thermal resistance in different electrical and thermal conditions. The consistent trends of simulations and experiments represent that the design of the heat dissipating path and geometry affects the measurement of thermal resistance.
Keywords
cooling; light emitting diodes; street lighting; thermal resistance; thermal resistance measurement; automotive lighting; electrical-optical conversion efficiency; heat dissipating path; high-power LED; high-temperature applications; light emitting diode lighting; steady-state thermal measurement techniques; street lighting; thermal resistance deviation; Electrical resistance measurement; Heat sinks; Light emitting diodes; Resistance heating; Temperature measurement; Thermal resistance; Light-emitting diode (LED); thermal engineering; thermal measurement; thermal resistance; thermal resistance.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2330340
Filename
6845354
Link To Document