DocumentCode :
731096
Title :
Recent development for a plasma diagnostic with optically trapped microparticles
Author :
Schneider, Viktor ; Kersten, Holger
Author_Institution :
Inst. of Exp. & Appl. Phys., Christian-Albrechts-Univ. Kiel, Kiel, Germany
fYear :
2015
fDate :
24-28 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. The idea to use microparticles for plasma diagnostic purposes was implemented during the last years by several experiments as electrostatic or thermal probes1-5. In contrast to the commonly used diagnostic methods, microparticles rarely influence the surrounding plasma. However, the particle position and, thus, the measurement is mostly restricted to the plasma sheath region by the force balance. A change in the position, often possible only into one direction, is then associated with a considerable effort or just by changing the discharge and, thus, by changing the plasma parameters itself. Based on the principle of laser tweezing6, we present a noninvasive method for trapping and arbitrary manipulation of the microparticles position in the plasma7. We demonstrate how an externally applied force on the particle is determined by a position determination in the trap. Furthermore, we present the current stage of development as well as some possible plasma diagnostic applications.
Keywords :
particle traps; plasma diagnostics; plasma sheaths; electrostatic probes; force balance; laser tweezing principle; optically trapped microparticles; plasma diagnostic applications; plasma sheath region; thermal probes; Atmospheric measurements; Charge carrier processes; Electrostatics; Force; Plasma diagnostics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location :
Antalya
Type :
conf
DOI :
10.1109/PLASMA.2015.7179558
Filename :
7179558
Link To Document :
بازگشت