DocumentCode
731382
Title
Nanosecond high power microwave window breakdown diagnostic and its mechanism
Author
Chang, C. ; Verboncoeur, J. ; Chen, C.H.
Author_Institution
Lab. on Sci. & Technol. of High Power Microwave, NINT, Xi´an, China
fYear
2015
fDate
24-28 May 2015
Firstpage
1
Lastpage
1
Abstract
Summary form only given. Multipactor and plasma discharge at windows are the major limiting factors in high power microwave HPM transmission and radiation[1-6]. Breakdown at the vacuum/dielectric interface is triggered by multipactor and finally realized by plasma avalanche in the ambient desorbed or evaporated gas layer above the dielectric1-10.The timeand space-dependent optical emissions of nanosecond high-power microwave discharges near a dielectric/air interface have been observed by nanosecond response four-framing ICCD cameras. The experimental observations indicate that plasma developed more intensely at the dielectric/air interface than at the free-space region with a higher electric-field amplitude. A thin layer of intense light emission above the dielectric was observed after the microwave pulse. The mechanisms of the new breakdown phenomena are analyzed by an electromagnetic field modeling and an electromagnetic particle-in-cell simulation, and the nonlinear positive feedbacks of ionization, higher electron mobility and ultraviolet-driven photoemission due to the elevated electron temperature are crucial for achieving the ultrafast discharge.
Keywords
electron mobility; high-frequency discharges; photoemission; plasma diagnostics; plasma nonlinear processes; plasma simulation; plasma temperature; dielectric-air interface; electric-field amplitude; electromagnetic particle-in-cell simulation; electron mobility; elevated electron temperature; evaporated gas layer; high power microwave HPM transmission; intense light emission; multipactor; nanosecond high power microwave window breakdown diagnostic; nanosecond high-power microwave discharges; nanosecond response four-framing ICCD cameras; nonlinear positive feedbacks; plasma avalanche; plasma discharge; space-dependent optical emissions; time-dependent optical emissions; ultraviolet-driven photoemission; vacuum-dielectric interface; Dielectrics; Discharges (electric); Microwave FET integrated circuits; Microwave integrated circuits; Microwave technology; Plasmas;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location
Antalya
Type
conf
DOI
10.1109/PLASMA.2015.7179912
Filename
7179912
Link To Document