Title :
Microstructure evolution and magnetic properties of nanocrystalline Ni75Fe25 thin films: Effects of substrate and thickness
Author :
Kaibi, A. ; Guittoum, A. ; Oksuzoglu, R.M. ; Yavru, C. ; Ozgun, S. ; Boudissa, M. ; Kechouane, M.
Author_Institution :
Phys. of Mater. Lab. (LPM), USTHB, Algiers, Algeria
Abstract :
Permalloy (Py) thin films were evaporated from nanocrystalline soft Ni75Fe25 powder onto glass and Al2O3 substrates. The thicknesses of these films range from 16 nm to 250 nm. The as deposited films were characterized by grazing incidence X-ray diffraction (GIXRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and vibrating sample magnetometry (VSM). From the GIXRD spectra, we have shown that the films are amorphous for the thinner films. However, for the thicker films, a polycrystalline FCC structure is present. For the intermediate thicknesses, the nature of substrate determines the texture of the films. The SEM micrographs indicate that the nature of substrate influences on the morphology and grains size of Py films. From AFM observations, the nanocrystalline nature of the grains is evidenced. Hysteresis loops reveals the ferromagnetic character of Py films. We have shown that the values of coercive field, Hc, generally, decrease with increasing thickness. Moreover, the Hc values are higher for films deposited onto a Al2O3 substrate than those on the glass substrate. The nature of substrate and thickness seems to influence the magnetic properties of Py films. A correlation between these physical properties will be established and discussed.
Keywords :
Permalloy; X-ray diffraction; amorphous magnetic materials; atomic force microscopy; coercive force; ferromagnetic materials; grain size; magnetic hysteresis; magnetic particles; magnetic thin films; nanofabrication; nanomagnetics; nanoparticles; scanning electron microscopy; soft magnetic materials; texture; vacuum deposition; AFM; Al2O3; GIXRD; Ni75Fe25; SEM; SiO2; VSM; aluminum oxide substrates; amorphous films; atomic force microscopy; coercive field; evaporation; ferromagnetic character; film thickness; glass; grain size; grazing incidence X-ray diffraction; hysteresis loops; magnetic properties; microstructural evolution; nanocrystalline nature; nanocrystalline permalloy thin films; nanocrystalline soft powder; physical properties; polycrystalline FCC structure; scanning electron microscopy; size 16 nm to 250 nm; substrate effects; substrate thickness; texture; vibrating sample magnetometry; Aluminum oxide; Films; Glass; Magnetic properties; Physics; Scanning electron microscopy; Substrates;
Conference_Titel :
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location :
Antalya
DOI :
10.1109/PLASMA.2015.7179987