Title :
An alternative technique to Perfectly Matched Layers to model anchor losses in MEMS resonators with undercut suspensions
Author :
Segovia-Fernandez, J. ; Xu, C. ; Cassella, C. ; Piazza, G.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper presents and experimentally validates a new numerical approach to accurately model anchor losses in MEMS resonators with undercut suspensions. This method is an alternative to the use of Perfectly Matched Layers (PMLs) and excels at predicting Q for those cases in which highly reflective boundaries are present. The proposed finite element method (FEM) imposes fixed-constraints (FC) at the edges of the released regions and the Q is calculated as the ratio of strain energy in both resonator and anchors and the total acoustic energy transferred to the substrate. This new approach is compared to the results obtained by using PML conditions and validated experimentally through measurement of 216 AlN resonators with resonance frequencies (fr) around 60 MHz. The comparison shows that the proposed numerical technique has a similar accuracy to PML in predicting Q, but it is superior to it when reflections from the boundaries become relevant.
Keywords :
III-V semiconductors; aluminium compounds; finite element analysis; microcavities; micromechanical resonators; wide band gap semiconductors; AlN; FEM; MEMS resonators; PML; acoustic energy; anchor losses; finite element method; perfectly matched layers; reflective boundaries; resonance frequencies; strain energy; undercut suspensions; Aluminum nitride; Boundary conditions; Finite element analysis; III-V semiconductor materials; Micromechanical devices; Substrates; Vibrations; Quality factor; anchor losses; finite element analysis; fixed-constraints; perfectly matched layers;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
DOI :
10.1109/TRANSDUCERS.2015.7181090