Title :
Novel compact two-dimensional CMOS vertical Hall sensor
Author :
Sander, C. ; Leube, C. ; Paul, O.
Author_Institution :
Dept. of Microsyst. Eng. (IMTEK), Univ. of Freiburg, Freiburg, Germany
Abstract :
We report a novel compact CMOS sensor enabling the measurement of both in-plane magnetic field components Bx and By at the same location. The sensor consists of four n-wells arranged essentially as a square and electrically interconnected into a conducting loop. Four contacts, one at the center of each n-well, serve as drive and sense contacts. The sensing principle is the same as in established vertical Hall sensors. By selectively switching the interconnections among the n-wells, the device is made sensitive alternatively to Bx and By. The sensitivity for both directions is about 5.6 mV/VT. At a nominal B field of 3.7 mT the RMS error of the measured magnitude and angle of B are 56 μT and 0.8°, respectively.
Keywords :
CMOS integrated circuits; Hall effect transducers; integrated circuit interconnections; magnetic field measurement; magnetic sensors; compact two-dimensional CMOS vertical Hall sensor; conducting loop interconnection; in-plane magnetic field measurement; magnetic flux density 3.7 mT; magnetic flux density 56 muT; magnitude measurement; n-well interconnection; CMOS integrated circuits; Contacts; Current measurement; Magnetic field measurement; Magnetic fields; Semiconductor device measurement; Sensitivity; 2D Hall device; CMOS sensor; angular sensor; vertical Hall sensor;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
DOI :
10.1109/TRANSDUCERS.2015.7181135