DocumentCode :
731905
Title :
“Crack-photolithography” for high-throughput nanopatterning and nanofluidic applications
Author :
Minseok Kim ; Dogyeong Ha ; Taesung Kim
Author_Institution :
Dept. of Mech. Eng., Ulsan Nat. Inst. of Sci. & Technol. (UNIST), Ulsan, South Korea
fYear :
2015
fDate :
21-25 June 2015
Firstpage :
1366
Lastpage :
1369
Abstract :
We present an innovative cracking-assisted nanofabrication technique that relies only on a standard photolithography (photoresist patterning) process. This novel technique produces arbitrary-shaped nanopatterns with well-controlled, various geometric dimensions in a large-area and high-throughput manner. In addition, we show that mixed-scale patterns fabricated using the technique can be used as a master mold for replicating numerous nanofluidic devices via soft lithography, which to the best of our knowledge has not been reported previously in material-failure-based techniques including cracking.
Keywords :
moulding; nanofabrication; nanofluidics; nanolithography; nanopatterning; photolithography; soft lithography; arbitrary shaped nanopatterns; crack photolithography; cracking assisted nanofabrication technique; high throughput nanopatterning; master mold; nanofluidic applications; nanofluidic devices; photoresist patterning process; soft lithography; Fabrication; Nanobioscience; Nanoscale devices; Resists; Soft lithography; Stress; crack; nanofluidics; nanopattern; photolithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
Type :
conf
DOI :
10.1109/TRANSDUCERS.2015.7181186
Filename :
7181186
Link To Document :
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