• DocumentCode
    732087
  • Title

    The Last Line Effect

  • Author

    Beller, Moritz ; Zaidman, Andy ; Karpov, Andrey

  • fYear
    2015
  • fDate
    18-19 May 2015
  • Firstpage
    240
  • Lastpage
    243
  • Abstract
    Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.
  • Keywords
    Browsers; Chromium; Cloning; Computer languages; Open source software; Reliability; Code Clones; Defects; Last Line Effect; Last Statement Effect; Micro-clone;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Program Comprehension (ICPC), 2015 IEEE 23rd International Conference on
  • Conference_Location
    Florence, Italy
  • Type

    conf

  • DOI
    10.1109/ICPC.2015.34
  • Filename
    7181452
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=732087