• DocumentCode
    732101
  • Title

    The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.´s CSFL Regression Model

  • Author

    Zhuofu Bai ; Shih-Feng Sun ; Podgurski, Andy

  • Author_Institution
    EECS Dept., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2015
  • fDate
    23-23 May 2015
  • Firstpage
    7
  • Lastpage
    13
  • Abstract
    This paper investigates the performance of Baah et al.´s causal regression model for fault localization when an important precondition for causal inference, called positivity, is violated. Two kinds of positivity violations are considered: structural and random ones. We prove that random, but not structural nonpositivity may harm the performance of Baah et al.´s causal estimator. To address the problem of random nonpositivity, we propose a modification to the way suspiciousness scores are assigned. Empirical results are presented that indicate it improves the performance of Baah et al.´s technique. We also present a probabilistic characterization of Baah et al.´s estimator, which provides a more efficient way to compute it.
  • Keywords
    inference mechanisms; regression analysis; software fault tolerance; CSFL regression model; causal inference; causal statistical fault localization; positivity; Flow graphs; Java; Mathematical model; Measurement; Probabilistic logic; Probability; XML; causal inference; conditional probability; positivity violation; statistical debugging; statistical fault localization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Complex Faults and Failures in Large Software Systems (COUFLESS), 2015 IEEE/ACM 1st International Workshop on
  • Conference_Location
    Florence
  • Type

    conf

  • DOI
    10.1109/COUFLESS.2015.9
  • Filename
    7181476