DocumentCode :
732153
Title :
Dynamic fault recovery using partial reconfiguration for highly reliable FPGAs
Author :
Alkady, Gehad I. ; El-Araby, Nahla A. ; Abdelhalim, M.B. ; Amer, H.H. ; Madian, A.H.
Author_Institution :
Electron. & Comm. Eng. Dept., American Univ. in Cairo, Cairo, Egypt
fYear :
2015
fDate :
14-18 June 2015
Firstpage :
56
Lastpage :
59
Abstract :
FPGAs are becoming more popular in the domain of safety-critical applications (such as space applications) due to their high performance, re-programmability and reduced development cost. Such systems require FPGAs with self-detection and self-repairing capabilities in order to cope with errors due to the harsh conditions that usually exist in such environments. In this paper, a new dynamic fault recovery technique is proposed using the runtime partial reconfiguration (PR) property in FPGAs. It focuses on open interconnect faults and relies on specifying a Partially Reconfigurable block in the FPGA that is only used during the recovery process after the failure of the first module in the system. The technique uses only one location to recover from errors in any of the FPGA´s modules. Accordingly, it requires less area overhead when compared to other techniques.
Keywords :
fault diagnosis; fault tolerance; field programmable gate arrays; FPGA module; PR property; development cost reduction; dynamic fault recovery technique; highly reliable FPGA; open interconnect fault; partially reconfigurable block; recovery process; reprogrammability; runtime partial reconfiguration property; safety-critical application; self-detection capability; self-repairing capability; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Integrated circuit interconnections; Single event upsets; FPGA; dynamic fault recovery; fault detection; fault-tolerance; interconnect; partial reconfiguration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Embedded Computing (MECO), 2015 4th Mediterranean Conference on
Conference_Location :
Budva
Print_ISBN :
978-1-4799-8999-7
Type :
conf
DOI :
10.1109/MECO.2015.7181865
Filename :
7181865
Link To Document :
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