DocumentCode
732235
Title
Variability budgetin pulsed flip-flops
Author
Alioto, Massimo ; Palumbo, Gaetano ; Consoli, Elio
Author_Institution
ECE - Nat. Univ. of Singapore (Singapore), Singapore, Singapore
fYear
2015
fDate
7-10 June 2015
Firstpage
1
Lastpage
4
Abstract
In this paper, the impact of variations on the most representative pulsed flip-flops topologies is comparatively evaluated in 65-nm CMOS. The analysis explicitly considers fundamental sources of variations such as process, voltage, temperature and clock slope. For each FF topology, the variations are statistically evaluated through Monte Carlo simulations and they explicitly include the non-negligible impact of layout parasitics.
Keywords
CMOS logic circuits; flip-flops; CMOS; Monte Carlo simulations; pulsed flip-flops; Clocks; Delays; Flip-flops; Sensitivity; Standards; Temperature sensors; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International
Conference_Location
Grenoble
Type
conf
DOI
10.1109/NEWCAS.2015.7182003
Filename
7182003
Link To Document