Title :
EMI resisting MOSFET-Only Voltage Reference based on the ZTC condition
Author :
Cordova, David ; Toledo, Pedro ; Klimach, Hamilton ; Bampi, Sergio ; Fabris, Eric
Author_Institution :
NSCAD Microeletronica, Porto Alegre, Brazil
Abstract :
Electromagnetic interference (EMI) can significantly degrade the performance of analog circuits, including DC voltage and current references, due to their limited Power Supply Rejection Ratio (PSRR). An EMI-resisting MOSFET-Only Voltage Reference is herein proposed, based on the MOSFET Zero Temperature Coefficient (ZTC) vicinity condition. The ZTC condition is analytically derived through a continuous MOSFET model that is valid from weak to strong inversion and a design methodology is proposed. The final circuit was designed in a 130 nm process and occupies around 0.0075 mm2 of silicon area while consuming just 10.3 μW. Post-layout simulations presented a Voltage Temperature Coefficient (VTC) of 146 ppm/°C, for a temperature range from -55 to +125°C. An EMI source of 4 dBm (1 VpP amplitude) injected in the power supply of our circuit, according to the Direct Power Injection (DPI) specification results in a maximum DC Shift and Peak-to-Peak ripple of 22.7 % and 11m Vpp, respectively.
Keywords :
MOSFET; analogue circuits; electromagnetic interference; reference circuits; semiconductor device models; DPI; EMI-resisting MOSFET-only voltage reference; MOSFET zero temperature coefficient; PSRR; VTC; ZTC condition; analog circuits; direct power injection; electromagnetic interference; power 10.3 muW; power supply rejection ratio; size 130 nm; temperature 55 degC to 125 degC; voltage temperature coefficient; Electromagnetic interference; Logic gates; MOSFET; Power supplies; Semiconductor device modeling; Temperature dependence; ZTC Condition; electromagnetic compatibility and interference; voltage and current reference;
Conference_Titel :
New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International
Conference_Location :
Grenoble
DOI :
10.1109/NEWCAS.2015.7182022