Electrostatic discharge sensitivity investigation on organic field-effect thin film transistors

Conventional CMOS technologies require high production costs, which are largely due to masks production and high specification equipment. Interestingly, conjugated polymers and plastic semiconductors offer potential substitutes to lower the production expenses. Such materials can be used in applications such as organic light-emitting diodes (OLEDs), organic field-effect transistors (OFETs), and organic photovoltaics (OPVs). However, electrical reliability, and especially potential damage by electrostatic discharge (ESD), is a major issue in the production cycle and cost, and also during operation. Here we present investigation of the ESD sensitivity of OFETs based on poly (3-hexylthiophene-2,5-diyl) (P3HT), which has so far received little or no attention in the literature.