Title :
Picometer-scale surface roughness measurements inside hollow glass fibres
Author :
Buet, X. ; Brun, C. ; Bresson, B. ; Ciccotti, M. ; Petrovitch, M.N. ; Poletti, F. ; Richardson, D.J. ; Vandembroucq, D. ; Tessier, G.
Author_Institution :
ESPCI, Lab. PMMF, Univ. Paris 6, Paris, France
Abstract :
A differential optical profilometry technique with picometre-range sensitivity is adapted to the non invasive measurement of the roughness inside hollow glass fibres by use of immersion objectives and index-matching liquid.
Keywords :
glass fibres; holey fibres; optical fibre testing; optical glass; photonic crystals; surface roughness; differential optical profilometry technique; hollow glass fibres; immersion objectives; index-matching liquid; noninvasive measurement; picometer-scale surface roughness measurements; picometre-range sensitivity; Glass; Optical fibers; Optical surface waves; Rough surfaces; Silicon compounds; Surface roughness; Surface waves;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
