DocumentCode
732466
Title
Random surface texturing of mc-Silicon for solar cells with picosecond lasers; a comparison between 1064 nm, 532 nm and 355 nm laser emission wavelengths
Author
Binetti, Simona ; Le Donne, Alessia ; Rolfi, Andrea ; Grilli, Emanuele ; Jaggi, Beat ; Neuenschwander, Beat ; Busto, Chiara ; Scorticati, Davide ; Longoni, Luca ; Pellegrino, Sergio
Author_Institution
Dept. of Mater. Sci., Univ. of Milano-Bicocca, Milan, Italy
fYear
2015
fDate
10-15 May 2015
Firstpage
1
Lastpage
2
Abstract
Multicrystalline Silicon was textured with picosecond laser. Different laser wavelengths (λ = 1064, 532, 355 nm) where compared regarding laser-induced damage. We found that λ = 355 nm picosecond radiation resulted in shallower defect-reach region.
Keywords
elemental semiconductors; high-speed optical techniques; laser beam effects; laser materials processing; silicon; surface texture; surface treatment; Si; laser emission wavelengths; laser-induced damage; multicrystalline silicon; picosecond laser; picosecond radiation; random surface texturing; shallower defect-reach region; solar cells; wavelength 1064 nm; wavelength 355 nm; wavelength 532 nm; Optical surface waves; Reflectivity; Silicon; Surface emitting lasers; Surface morphology; Surface texture; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
7182897
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