Title :
Particle vs. mode entanglement in optical quantum metrology
Author :
Quesada, Nicolas ; Sahota, Jaspreet
Author_Institution :
McLennan Phys. Labs., Univ. of Toronto, Toronto, ON, Canada
Abstract :
We present a constructive proof of the fact that mode entanglement is not necessary for optical quantum enhanced metrology (QEM) but particle entanglement is. We provide a particle entanglement witness that detects all path symmetric states useful for QEM in a Mach-Zender interferometer.
Keywords :
Mach-Zehnder interferometers; light interference; photodetectors; quantum entanglement; quantum optics; Mach-Zender interferometer; QEM; all-path symmetric state detection; mode entanglement; optical quantum enhanced metrology; particle entanglement; Metrology; Optical interferometry; Optical sensors; Photonics; Probes; Protocols; Quantum entanglement;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
