• DocumentCode
    732921
  • Title

    Beam deflection measurements of nondegenerate nonlinear refractive indices in direct-gap semiconductors

  • Author

    Peng Zhao ; Reichert, Matthew ; Ensley, Trenton R. ; Hagan, David J. ; Van Stryland, Eric W.

  • Author_Institution
    Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2015
  • fDate
    10-15 May 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We use the beam-deflection method to measure nondegenerate nonlinear refractive indices of ZnO and ZnSe and show, in agreement with theory, extremely nondegenerate nonlinear refraction is significantly larger than in the degenerate or near-degenerate case.
  • Keywords
    II-VI semiconductors; laser beams; optical Kerr effect; refractive index; wide band gap semiconductors; zinc compounds; ZnO; ZnSe; beam deflection measurements; direct-gap semiconductors; nondegenerate nonlinear refractive index; Dispersion; II-VI semiconductor materials; Nonlinear optics; Probes; Semiconductor device measurement; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2015 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    7183358
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=732921