Title :
Spatial and spectral ellipsometry of light filaments
Author :
Arissian, Ladan ; Rostami, Shermineh ; Diels, Jean-Claude
Author_Institution :
Center for High Tech Mater., Univ. of New Mexico, Albuquerque, NM, USA
Abstract :
Measuring the continuum polarization against pulse ellipticity of a laser filament is introduced as a new paradigm for quantifying nonlinearities in filamentation such as ionization paths, molecular alignment, nonlinear index and field intensity.
Keywords :
ellipsometry; ionisation; laser beams; light polarisation; nonlinear optics; optical pulse generation; continuum polarization; field intensity; filamentation; ionization paths; laser filament; light filaments; molecular alignment; nonlinear index; pulse ellipticity; spatial ellipsometry; spectral ellipsometry; Focusing; Laser beams; Measurement by laser beam; Particle beams; Polarization; Pulse measurements; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
