Title :
Topological darkness revisited: A four-dimensional picture
Author :
Haomin Song ; Xie Zeng ; Dengxin Ji ; Nan Zhang ; Kai Liu ; Qiaoqiang Gan
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York at Buffalo, Buffalo, NY, USA
Abstract :
We present a complete description of “topological darkness” in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.
Keywords :
optical constants; thin films; effective media; four-dimensional picture; four-dimensional space; incident angles; light-matter interaction; optical constants; thin-films; topological darkness; Absorption; Dispersion; Optical films; Optical interferometry; Optical reflection; Three-dimensional displays;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
