DocumentCode :
733179
Title :
Optical and microwave properties of focused ion beam implanted Erbium ions in Y2SiO5 crystals
Author :
Kukharchyk, Nadezhda ; Probst, Sebastian ; Pal, Shovon ; Kangwei Xia ; Kolesov, Roman ; Ludwig, Arne ; Ustinov, Alexey V. ; Bushev, Pavel ; Wieck, Andreas D.
Author_Institution :
Angewandte Festkorperphys., Ruhr-Univ. Bochum, Bochum, Germany
fYear :
2015
fDate :
10-15 May 2015
Firstpage :
1
Lastpage :
2
Abstract :
We present focused ion beam implantation as a prospective tool for realizing a patterned rare-earth spin-ensemble in a solid-state substrate. We demonstrate a successful implantation with 20% of luminescent ion activation for Erbium ions in Y2SiO5 crystals.
Keywords :
erbium; focused ion beam technology; microwave photonics; photoluminescence; silicon compounds; sputter etching; yttrium compounds; Y2SiO5:Er; focused ion beam implanted erbium ions; luminescent ion activation; microwave properties; optical properties; patterned rare-earth spin-ensemble; solid-state substrate; Couplings; Crystals; Erbium; Optical coupling; Optical resonators; Particle beam optics; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
7183616
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=733179
بازگشت